By Daizhong Su; Qingbin Zhang; Shifan Zhu

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Additional resources for Advanced design and manufacture III : selected, peer reviewed papers from the 3rd International Conference on Advanced Design and Manufacture (ADM2010), 8-10 September 2010, Nottingham, UK

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Fig. 3 shows the fluid property variations with the increase of entrapped air ratio. Fig. 05% to 2%. Fig. 3(b) also illustrates that the mean flow loss has a small descent of 2% during that cases. 82% remarkable descent, respectively. Therefore, the density, the viscosity and the flow loss are robust to entrapped air ratio variations, but the modulus and the stiffness are considerably sensitive to those variations, and those sensitivities should not be omitted during pertinent simulations. 5 1 892 0 Mean modulus (Pa) .

Introduction Coordinate Measuring Machines (CMMs) have been widely used in industry to determine the form / dimensional tolerances of complex workpieces during the manufacturing and quality control phases. By virtue of their probes, CMMs can acquire the dimensional data on such parts. State-of-the-art probe designs can be classified into two categories: touch-trigger (switching/touch) probes and scanning (measurement) probes. A touch-trigger probe, which is suitable for (conventional) point-to-point measurement tasks, generates an electrical signal (or pulse) as soon as its stylus contact the part for a predetermined contact force.

1 is a translation/adaptation of the general scheme of the product life cycle (see [7, 6]), but considered for a complex product containing sub-assemblies. The existence of a main developer and of secondary developers has been assumed. The main developer provides: a) the entire product development as well as that of some sub-assemblies and components that it produces, b) the coordination of different teams of developers, c) the mutual compatibility of sub-assemblies. The secondary developers (third parties) have the tasks of: a) developing sub-assemblies performed by the main developer, b) developing and implementing sub-assemblies that have been tasked to them.

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Advanced design and manufacture III : selected, peer by Daizhong Su; Qingbin Zhang; Shifan Zhu
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